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UMC
TARGETS CAMERA-ON-A-CHIP DEVELOPERS WITH ENHANCED CMOS IMAGE SENSOR
TECHNOLOGY
0.18-micron
Processes to Provide Smaller Pixel Size, Higher Resolution in Q1,
2001
SUNNYVALE,
Calif., January 8, 2001--UMC (NYSE: UMC), a leading semiconductor
foundry, today announced an enhanced CMOS image sensor process,
which is based on its generic mixed-mode process. The unique proprietary
technology will address the needs of today's most sophisticated
camera-on-a-chip designers that produce chips for high-end, still
life and video digital cameras and scanners. Because of its lower
than average dark current level, UMC's sensor process allows image
sensors designed in its process to detect light at lower light conditions.
The result is image quality that is superior to any other foundry
CMOS technology. CMOS sensors now being fabricated with UMC's sensor
process are rapidly becoming a cost-effective replacement for competing
charged coupled device (CCD) and other CMOS sensors.
When the sensor
is integrated using emerging SOC methodology, the integrated circuit
becomes a camera-on-a-chip with the ability to generate high-quality
color images with small pixel sizes and high resolutions. In fact,
UMC's CMOS process is the first to demonstrate "3-in-1 integration",
i.e., integration of an analog to digital converter, digital image
processor and a high performance sensor onto a single chip. UMC
will be accepting design-ins for its 0.18-micron CMOS sensor, which
will enable pixel sizes as low as three microns and resolutions
above 5 megapixels in the first quarter of 2001.
"Because
our CMOS image sensor solution offers high quality and resolution
and is cost effective, it clearly addresses the requirements of
chip developers for the digital camera market,"said Jim Ballingall,
vice president of worldwide marketing at UMC. "Our solution
is clearly unparalleled in the foundry space in its comparability
to CCD, the key being exceptionally low dark current levels –as
low as 65 pA/cm2 –which allow for high image quality regardless
of light conditions. The transition from CCD to UMC's CMOS sensor
process is further facilitated by the fact that changes in optics
are not necessary due to the small pixel sizes that are enabled
by the process. Particularly exciting is the fact that this complements
our offerings in advanced logic, mixed-signal, and micro-display
technologies so that customers can access UMC for a complete digital
camera solution."
Sabrina Kemeny,
CEO at Photobit Corporation said, "As a leading supplier of
CMOS image sensors, we must keep up with the market's high demand
for video imaging products by delivering the most leading-edge camera
system on a chip. UMC's CMOS sensor process has by far exceeded
our expectations for quantum efficiency and sensitivity. We look
forward to continuing our long-term relationship with UMC as they
continue to deliver the highly-reliable, excellent quality image
sensor process technology we need for development of our camera-on-a-chip."
Dr. Derek Cheung,
Rockwell's vice president of research and director of the Rockwell
Science Center said, "We committed to UMC's 0.25-micron CMOS
image sensor process technology for developing our CMOS imaging
system-on-a-chip (i-SoC) for high performance video cameras, because
it enables us to offer comparable resolution and image quality to
incumbent CCDs with obvious cost advantages and an unprecedented
set of embedded features. We look forward to migrating to UMC's
0.18-micron process soon and achieving even greater performance."
Note From
UMC Concerning Forward-Looking Statements
Some of the
statements in the foregoing announcement are forward looking within
the meaning of the U.S. Federal Securities laws, including statements
about future outsourcing, wafer capacity, technologies, business
relationships and market conditions. Investors are cautioned that
actual events and results could differ materially from these statements
as a result of a variety of factors, including conditions in the
overall semiconductor market and economy; acceptance and demand
for products from UMC; and technological and development risks.
Editorial
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