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UMC
Group's Gold Logic Copper Interconnect Technology Reaches Next
Phase of Development
SUNNYVALE,
Calif.—April 12, 1999—UMC Group today announced it has reached
several development milestones with its copper interconnect technology.
The company, which has aggressively pursued its copper development
program since early 1998, has made significant progress in its
mission to offer copper interconnect technology to early adopters
on its Gold LogicTM L180 Cu (0.18um) platform later this year.
Fu Tai Liou,
senior vice president of UMC Group in charge of technology development
said, "Copper promises higher performance, higher packing
density, and better reliability. We have already demonstrated
dual-damascene process flows for copper interconnect in multi-level
structures, and demonstrated key reliability performance data,
including a 30x improvement in electromigration reliability over
aluminum metalization, junction stability, and comparable yields
for copper relative to aluminum. Copper will also offer significant
cost advantages because the process integration steps are simpler."
Jim D. Kupec,
president of UMC Group (USA) noted, "The move to copper interconnect
technology is a major trend as we continue to scale down to finer
geometries. UMC Group recognized this significance of copper early,
and this is why we are leading the pure-play semiconductor market
sector in terms of offering wafers with copper interconnect structures.
The appeal of copper is clear, increased performance and density
at reduced costs."
Jim Kupec
continued, "We have aligned with best-in-class software and
hardware companies to develop processes incorporating copper interconnect
technology for 0.18, 0.15 and 0.12um generation integrated circuits
(ICs). Through our strategic development partnerships with the
leading companies in each area of wafer processing, we are ensuring
that our high-performance copper interconnect technology will
be available in a time frame that will allow our customers in
intensely performance-driven markets to gain a competitive advantage."
The copper
interconnect partners, that have been working with UMC Group since
early development efforts, include a broad range of industry leading
companies. Novellus, a supplier of thin film deposition technologies
for creating advanced ICs, has provided products from its DamascusR
Complete Copper? suite, including its SABRE? copper electrofill
tool and equipment for dielectrics deposition in a dual damascene
process. SABRE enables production-worthy, void-free copper fill
in extremely deep, narrow trenches. SpeedFam-IPEC provided its
776 CMP copper processing system which provides greater flexibility
and capabilities for UMC Group's production. KLA-Tencor provided
copper interconnect defect reduction and process parametric control
solutions, helping UMC to quickly identify and source critical
yield- and performance-related process integration issues. Critical
copper polishing is being accomplished using high-performance
chemical mechanical planarization (CMP) slurries from Cabot Corporation's
Microelectronic Materials Division, the leading global supplier
of these and other slurry materials to the semiconductor industry.
UMC Group's
alliance with Synopsys will enable designers to take advantage
of this new technology. Synopsys will announce shortly that it
is developing transistor-level power, timing and layout extraction
tools that will enable users to more readily target UMC Group's
copper interconnect devices.
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