UMC

  • Process
    Technologies
    • Advanced
      Technology
    • 28nm
    • 40nm
    • 55nm
    • 65nm
    • 90nm
    • Specialty
      Technology
    • MS/RFCMOS
    • Mature Nodes/UMC A+
    • eNVM
    • eHV
    • PMIC
    • Sensor Solutions
  • World-class
    Manufacturing
    • 300 mm Manufacturing Leadership
    • Competitiveness through Productivity
    • Advanced Automation
    • Fab Info
  • Back-end
    Services
    • Testing Service
    • Package Solution Development
    • Product Yield Management Service
  • Design
    Support
    • Mask Service
    • Silicon Shuttle
    • Libraries and IP
    • Design Verification
    • Design for Manufacturing
    • Design Kit and Manual
    • Design Flow Reference
  • My UMC
  • English
    • 繁體中文
    • 简体中文
    • 日本語
    • 한국어
  • Search
  • 28-nanometer TechnologyLEARN MORE >
  • UMC Second Quarter 2014 Earnings Release & Investor Conference CallLEARN MORE >
  • UMC Selected as a DJSI Global Component for Seventh Consecutive Year
  • 2014/10.09UMC Board Resolves to Enter a Joint Venture Agreement for a 12” Fab in China
  • 2014/09.16UMC Selected as a DJSI Global Component for Seventh Consecutive Year
  • 2014/09.03NJR Analog ICs Manufactured at UMC Adopted by Major Japanese Auto OEM
About UMC
  • Overview
  • Leadership
  • History
  • Intellectual Property Security Policy
Investors
  • Financials
  • Reports
  • Events
  • Stock Info
  • Corporate Governance
  • FAQs
  • Contact IR
Corporate Sustainability
  • Green Fab
  • Education and Training
  • Social Welfare
  • CS Report
Press Center
  • Press Releases
  • Photo Gallery
  • Literatures
Careers
  • Job Search
  • Working Environment
  • Employee Benefits
Popular Links
  • 28-nanometer Technology
  • UMC A+ Technology
  • 2013 CS Report
  • Awards and Certificates
  • Contact
  • Sitemap
  • Terms of Use

Copyright © United Microelectronics Corporation 2010-2014, All Rights Reserved.